HUJI-Facilities
Information Facilities
Electrochemical equipment (Autolab); DMol3 of Material Studio (Accelrys) Software for modeling
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Sample Preparation Laboratory with multiple abilities.
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Instrumentation Facilities
Variable angle spectroscopic ellipsometry (VASE, Woollam Co.)
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UV-Vis-NIR spectrophotometer (Shimadzu UV3101PC), containing Reflection attachment with integration sphere
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Spectrofluorimeter Shimadzu RF-5301 PC; Lifetime measurement equipment (Picoquant); Probe station equipped with I-V source Measure Units (Karl Suss PM 8)
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In addition, Dr. S. Yitzchaik is a member of the HUJI Nanoscience and Nanotechnology Center. This center has instrumentation for nanomaterials characterization: high resolution TEM (Technai F 20 G2)
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Scanning probe microscope (Nanoscope Dimension 3100 with Nanoscope IV controller); XPS (X-ray Photoelectron Spectrometer (Kratos Analytical); X-ray diffractometer (D8 Advance, Bruker); High Vacuum Sp
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